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| Instructor: |
Ian G. Harris |
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| Goals: |
This course will provide an overview of issues related to the testing
and reliability of VLSI circuits. The first part of the course will be
dedicated to learning the basics of manufacturing test and design
validation including fault simulation, fault modeling, and automatic
test generation. The midterm and the problem sets will be devoted to
these topics. The second part of the course will be research-oriented
involving the reading and presentation of current research in
test. Each student will be required to complete a final project and
will be expected to write a paper on that project. Most
projects will be group projects but individual projects are also
possible. Each student will also be expected to give two presentations
during the course of the quarter, one on the previous work related to
their final project, and another on their final project itself.
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| Book: |
Michael Bushnell and Vishwani Agrawal,
Essentials of Electronic Testing for Digital, Memory, and
Mixed-Signal VLSI Circuits , Kluwer Academic Publishers, 2000.
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| Requirements: |
- Problem Sets (2): 30%
- Tests (2): 35%
- Final Project: 35%
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| Time/Place: |
TuTh 9:30-10:50, CS 253 |
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| Prerequisites: |
An undergaduate-level course in Digital
Logic Design and Computer Architecture/Hardware Organization |